| Autor: |
Antonio Barion, Martijn J. H. Anthonissen, Jan H. M. ten Thije Boonkkamp, Wilbert L. IJzerman |
| Rok vydání: |
2022 |
| Zdroj: |
EPJ Web of Conferences. 266:02002 |
| ISSN: |
2100-014X |
| DOI: |
10.1051/epjconf/202226602002 |
| Popis: |
The Lie algebraic method offers a systematic way to find aberration coefficients of any order for plane-symmetric reflective optical systems. The coefficients derived from the Lie method are in closed form and solely depend on the geometry of the optical system. We investigate and verify the results for a single reflector. The concatenation of multiple mirrors follows from the mathematical framework. |
| Databáze: |
OpenAIRE |
| Externí odkaz: |
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