X-ray photoelectron diffraction of Ni(110)-2 × 1-CO p2mg layer
Autor: | O. Knauff, V. Fritzsche, H.P. Bonzel, U. Grosche |
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Rok vydání: | 1992 |
Předmět: | |
Zdroj: | Molecular Physics. 76:787-805 |
ISSN: | 1362-3028 0026-8976 |
DOI: | 10.1080/00268979200101681 |
Popis: | The ordered adsorbed CO layer of (2 × 1) p2mg symmetry on a Ni(110) surface was studied by X-ray photoelectron diffraction over a polar angle range Θ = ± 85° and for four different azimuthal orientations. Forward scattering enhancement peaks in the C 1s photoelectron intensity were detected at various angles, being due to intramolecular as well as intermolecular scattering. In particular, strong intermolecular scattering peaks were found at ± 68° along the [001] azimuthal direction. The anisotropy in intensity is about 46% compared to 67% for the intramolecular scattering peak at ±21°. Multiple scattering calculations for different CO adsorbate configurations and binding sites on Ni(110) were performed. A comparison with the experimental data, corrected for the instrument function, supports the on-top binding site for CO and a linear Ni-C-O configuration. Thus, XPD has been used for the first time to evaluate adsorbate registry, in addition to the bond and molecule orientation. |
Databáze: | OpenAIRE |
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