Structural and optical studies of evaporated bis-(dimethylglyoximato)nickel(II) thin films
| Autor: | Y. Ali-Mohamed Ahmed, A.A. Dakhel, Fryad Z. Henari |
|---|---|
| Rok vydání: | 2006 |
| Předmět: |
Diffraction
Organic Chemistry Analytical chemistry chemistry.chemical_element Substrate (electronics) Crystal structure Atomic and Molecular Physics and Optics Electronic Optical and Magnetic Materials Amorphous solid Inorganic Chemistry Nickel chemistry Absorption edge Vacuum deposition Electrical and Electronic Engineering Physical and Theoretical Chemistry Thin film Spectroscopy |
| Zdroj: | Optical Materials. 28:925-929 |
| ISSN: | 0925-3467 |
| DOI: | 10.1016/j.optmat.2005.05.001 |
| Popis: | Thin bis-(dimethylglyoximato)nickel(II) films of amorphous and crystalline structures were prepared by vacuum deposition on glass substrate held at room temperature. The crystal structure and the orientation of the samples were studied by the X-ray diffraction. The spectral absorption spectrum, which has several peaks in the studied wavelength range (200–1100 nm) was described and explained. The spectral absorption coefficient at the fundamental absorption edge in the UV region was determined. The nonlinear absorption coefficient, real and imaginary parts of the third-order optical nonlinearities χ(3) have been determined at 580 nm by using z-scan technique. |
| Databáze: | OpenAIRE |
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