Photoluminescence decay profiles of exciton‐exciton scattering in a ZnO thin film

Autor:	Masaaki Nakayama, Shuji Wakaiki, Hideki Ichida, DaeGwi Kim, Yasuo Kanematsu, Kohji Mizoguchi
Rok vydání:	2010
Předmět:	Photoluminescence Materials science business.industry Scattering Exciton Condensed Matter Physics Molecular physics Condensed Matter::Materials Science Decay time Polariton Optoelectronics Group velocity Thin film business Excitation
Zdroj:	physica status solidi c. 8:116-119
ISSN:	1610-1642 1862-6351
DOI:	10.1002/pssc.201000675
Popis:	We have investigated the photoluminescence (PL) dynamics of a ZnO thin film under intense excitation conditions at 10 K. In the ZnO thin film, a PL band due to exciton-exciton scattering, the so-called P emission, appears. The optical-Kerr-gating method with the ultrashort gating time of 0.6 ps enabled us to obtain precise information of the temporal profiles including the peak energy, the bandwidth and the intensity of the P emission, at various detection energies. We have found that the decay time of the P emission gradually shortens with decreasing detection energy. The change in the decay time can be reasonably attributed to the photon-like characteristics of the lower polariton branch that is the final state of the exciton-exciton scattering. Furthermore, we have shown that the decay time of the P emission is phenomenologically determined by the group velocity of the final state although the origin of the long decay time remains to be elucidated (© 2011 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim)
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::3ea1ca377fae023df92360946122da6c https://doi.org/10.1002/pssc.201000675 Zobrazit plný text záznamu Plný text