Autor: |
Stanley W. Czarnecki, Peter J. Golcher, D.J. Richard, W. Bookin, Michelle Lam, Icko E. T. Iben |
Rok vydání: |
2007 |
Předmět: |
|
Zdroj: |
2007 29th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD). |
DOI: |
10.1109/eosesd.2007.4401744 |
Popis: |
Magnetic tape heads use a multiplicity of highly ESD sensitive read sensors. With 36 or more sensors per head in a magnetic storage tape drive, a loss in a manufacturing environment of 1000 ppm per sensor is very costly. ESD damages caused by manufacturing processes, fixtures, material and faulty testers are investigated and reviewed. A new type of ESD failure is revealed in the study. Solutions are suggested to improve and amend the observed problems. |
Databáze: |
OpenAIRE |
Externí odkaz: |
|