Radiation damage (blistering) in Al, Cu, Si by exposure to a plasma focus discharge

Autor:	V. Nardi, C. Cortese, W. H. Bostick, W. Prior, P.J. Fillingham, J. Choi
Rok vydání:	1976
Předmět:	Nuclear and High Energy Physics Materials science Dense plasma focus Ion beam Scanning electron microscope Blisters Ion Ion beam deposition Nuclear Energy and Engineering Physics::Plasma Physics medicine Radiation damage General Materials Science Irradiation Atomic physics medicine.symptom
Zdroj:	Journal of Nuclear Materials. 63:356-372
ISSN:	0022-3115
DOI:	10.1016/0022-3115(76)90350-0
Popis:	Plates of Al, Cu (polycrystalline) and Si (monocrystal) have been irradiated with beams of D + ions (keV to MeV) and other radiation by exposure to a single discharge of a 5–10-kJ Plasma Focus in deuterium. Scanning electron microscope and elemental X-ray energy dispersive analysis are used for diagnostics. The nonuniformity of the ion beam causes a nonuniform damage with formation of clusters of blisters. A statistical analysis of blister parameters (diameter and skin thickness) is used to investigate the internal structure of a deuteron beam ejected from the plasma. The value K ∼ 10–20 keV is obtained as the typical ion energy for the bulk of the deuterons and an ion energy E ∼ 200–230 keV is typical for individual ion groups (ion strings) forming the high-energy deuteron beam.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::3e24f4f55e2f72ac099aad153342610e https://doi.org/10.1016/0022-3115(76)90350-0 Zobrazit plný text záznamu