Correlation of Connector Contact Failures in Accelerated Testing and in Long-term Use Field Vehicles

Autor: Jian Song, Abhay Rammurti Shukla, Dirk Hilmert, Christian Koch, Haomiao Yuan
Rok vydání: 2019
Předmět:
Zdroj: 2019 IEEE Holm Conference on Electrical Contacts.
Popis: One of the most frequently asked questions with regard to a laboratory test is whether the test conditions are relevant for field operation. This is especially the case for a multivariable life test, which should reflect real operating field conditions. This paper introduces an approach to answer this question. Systematical damage analysis of connectors from multivariable life tests with various thermal and mechanical conditions and connectors from vehicles after very long-term use in the field was conducted. Both the various damage types and the frequency of these damages are considered, thereby revealing the correlation between the conditions in the laboratory tests and operation under field conditions.
Databáze: OpenAIRE