Thermally-activated failure mechanisms of 0.25 \ \mu \mathrm{m}$ RF AIGaN/GaN HEMTs submitted to long-term life tests
| Autor: | Zhan Gao, Francesca Chiocchetta, Fabiana Rampazzo, Carlo De Santi, Mirko Fornasier, Gaudenzio Meneghesso, Matteo Meneghini, Enrico Zanoni |
|---|---|
| Rok vydání: | 2023 |
| Zdroj: | 2023 IEEE International Reliability Physics Symposium (IRPS). |
| DOI: | 10.1109/irps48203.2023.10118131 |
| Databáze: | OpenAIRE |
| Externí odkaz: |
|