Cm(III) Sorption onto Sapphire (α-Al2O3) Single Crystals

Autor:	Horst Geckeis, R. Klenze, Th. Fanghänel, Th. Rabung, Dieter Schild
Rok vydání:	2004
Předmět:	Crystal Materials science X-ray photoelectron spectroscopy Homogeneous Materials Chemistry Analytical chemistry Sapphire Sorption Physical and Theoretical Chemistry Spectroscopy Fluorescence Spectral line Surfaces Coatings and Films
Zdroj:	The Journal of Physical Chemistry B. 108:17160-17165
ISSN:	1520-5207 1520-6106
DOI:	10.1021/jp040342h
Popis:	In the present study, Cm(III) sorption onto different crystal planes (018), (104), (012), (110), and (001) of sapphire single crystals (area 1 cm2) is investigated at low Cm(III) concentrations and at pH 4.5 and 5.1 by time-resolved laser fluorescence spectroscopy (TRLFS), X-ray photoelectron spectroscopy (XPS), α-spectrometry, and autoradiography. A homogeneous Cm(III) distribution on the sapphire surfaces is demonstrated by autoradiography for all samples. Sorbed Cm(III) concentrations are in the range 2 × 10-12 − 7 × 10-11 mol/cm2 or 0.02−0.4 atoms/nm2. TRLFS and XPS spectra of sufficient intensity are obtained for all samples, proving the sensitivity of these techniques and their applicability at very low Cm(III) concentrations. TRLFS spectra of Cm(III) sorbed onto the (001) surface show distinct differences with regard to peak position and fluorescence lifetime compared to those obtained for the other four crystal planes. Similar information is available from XPS. The extent of Cm(III) sorption diffe...
Databáze:	OpenAIRE
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