Real-time, in-situ monitoring of Gamma radiation effects in packaged silicon photonic chips
| Autor: | Derek Kita, Danhao Ma, Shaoliang Yu, Haijie Zuo, Mo Li, Bingzhao Li, Juejun Hu, Tian Gu, Jérôme Michon, Qingyang Du, Anuradha M. Agarwal |
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| Rok vydání: | 2020 |
| Předmět: |
Silicon photonics
Materials science business.industry Compton scattering Gamma ray 02 engineering and technology Radiation 021001 nanoscience & nanotechnology 01 natural sciences Radiation effect 010309 optics chemistry.chemical_compound chemistry 0103 physical sciences Silicon carbide Optoelectronics Photonics 0210 nano-technology business Refractive index |
| Zdroj: | Conference on Lasers and Electro-Optics. |
| DOI: | 10.1364/cleo_si.2020.sm3j.5 |
| Popis: | We measured in-situ gamma radiation effect and post-radiation relaxation behavior on packaged SiC integrated photonic devices. A method to deconvolve the radiation responses from constituent materials was also proposed and validated. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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