Transmission electron microscopy and transistor characteristics of the same carbon nanotube
| Autor: | Dirk Obergfell, Jannik C. Meyer, Shangfeng Yang, Shihe Yang, Siegmar Roth |
|---|---|
| Rok vydání: | 2004 |
| Předmět: |
Materials science
Fullerene Physics and Astronomy (miscellaneous) business.industry Ambipolar diffusion Bipolar junction transistor Nanotechnology Carbon nanotube Carbon nanotube field-effect transistor law.invention Carbon nanotube quantum dot Condensed Matter::Materials Science Transmission electron microscopy law Optoelectronics Field-effect transistor business |
| Zdroj: | Applied Physics Letters. 85:2911-2913 |
| ISSN: | 1077-3118 0003-6951 |
| Popis: | A technique is presented which allows one to combine TEM investigations with transport measurements and potentially a wide range of other investigations on the same nanoobject. Using this technique, we have obtained high-resolution transmission electron microscopy images and transport investigations including transfer characteristics on the same single-walled carbon nanotube. The transfer characteristics show ambipolar transport. This observation is discussed taking into account TEM information on tube diameter, number of tubes in the bundle, and possible tube filling with fullerenes (peapods). |
| Databáze: | OpenAIRE |
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