A plane wave diffraction on a pin-hole in a film with a finite thickness and real electrodynamic properties

Autor:	Nikolay I. Chkhalo, M. N. Toropov, Illarion A. Dorofeev, N. N. Salashchenko
Rok vydání:	2008
Předmět:	Wavefront Point diffraction interferometer Physics Permittivity Diffraction Optics business.industry Optical engineering Plane wave Dielectric business Finite thickness
Zdroj:	SPIE Proceedings.
ISSN:	0277-786X
DOI:	10.1117/12.802354
Popis:	On a base of the Kirchhoff-Helmholtz method and using the Green function for a half-space which is covered by a film of any thickness and with arbitrary optical properties, amplitude-phase characteristics of diffracted on a pin-hole field were calculated. Analysis was carried out for some materials of the film at radiation wave-length λ0=633 nm using experimental values of the dielectric constants. The diffracted wave front has deformations which dependent on the film thickness and material electrodynamic characteristics, and the observation angle. The deformation determined by the film thickness essentially limits an accuracy provided by point diffraction interferometers.© (2008) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.
Databáze:	OpenAIRE
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