Single-use systems bag assembly leakage and defect toolkit

Autor:	Joseph ChartierLuke Coxon, Richard Bhella, George Gonnella, Joanna Tong, Christian Wood, Christine Marnez, Van Duong, Daniel C. Chung, Benita Powell Satchel, Patti Leazott, Soham Ghosh, Sarah Evelyn Mabel, Yongchun Zhang, Henry Ip, Tom McHenry, Frederic Michel, Lisa Marie Waldschmidt, Jason J Sootkoos, Elizabeth Hickey, Scott Bonney, Travis Foley, Trishna Ray-Chaudhuri
Rok vydání:	2020
Předmět:	Single use Materials science business.industry Optoelectronics business Leakage (electronics)
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::3d5c539a4a95060b710788c2569b4d55 https://doi.org/10.46220/2020ds007 Zobrazit plný text záznamu