Thickness dependence of microstructures and magnetic properties for CoPt/Ag nanocomposite thin films
| Autor: | S.C. Chen, K.T. Huang, Y. S. Li, Chih Long Shen, G.P. Lin, Po-Cheng Kuo, S.L. Ou |
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| Rok vydání: | 2010 |
| Předmět: |
Materials science
Nanocomposite Condensed matter physics Annealing (metallurgy) Metals and Alloys Mineralogy Surfaces and Interfaces Calcium nitride Coercivity Microstructure Surfaces Coatings and Films Electronic Optical and Magnetic Materials chemistry.chemical_compound Magnetic anisotropy chemistry Materials Chemistry Perpendicular Thin film |
| Zdroj: | Thin Solid Films. 518:7356-7359 |
| ISSN: | 0040-6090 |
| Popis: | Ag underlayer (30 nm) has improved the degree of ordering and perpendicular magnetic anisotropy of CoPt films (7.5–10 nm). After annealing at 600 °C and 700 °C, the perpendicular coercivity of CoPt/Ag films has been raised as the thicknesses of CoPt layers are increased. The magnetic easy axis of CoPt/Ag films would change from a random orientation to an out-of-plane orientation. It is found that Ag underlayer with thickness of 30 nm can improve the perpendicular magnetic properties of CoPt layers with thicknesses in the range of 7.5–10 nm. The CoPt/Ag films would be a candidate for perpendicular magnetic recording media. |
| Databáze: | OpenAIRE |
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