Secondary Electron Emission Yields from a CsI Surface Under Impacts of Large Molecules at Low Velocities (5 × 103−7 × 104 ms−1)

Autor: Y. Le Beyec, P. Chaurand, E.S. Parilis, Alain Brunelle, Serge Della-Negra
Rok vydání: 1997
Předmět:
Zdroj: Rapid Communications in Mass Spectrometry. 11:353-362
ISSN: 1097-0231
0951-4198
DOI: 10.1002/(sici)1097-0231(19970228)11:4<353::aid-rcm865>3.0.co;2-4
Popis: The yields of electron emission from a CsI surface bombarded with very heavy molecular ions have been measured by coincidence counting in time-of-flight mass spectrometry. These ions were produced by the matrix-assisted laser desorption/ionization technique. The masses ranged from 700 to 66 000 Da with velocities V between 5 × 103 and 7 × 104 ms−1. An electron emission rate of a few per cent was measured for the smaller impact velocities. The variations of the electron yields with mass and velocity are compared to previous data and analysed by different models. A sublinear mass dependence is observed as well as a V4 dependence at low velocity. © 1997 John Wiley & Sons, Ltd.
Databáze: OpenAIRE
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