Application of Tungsten as a Barrier Layer in Sc/Si Multilayer X-ray Mirrors

Autor:	V. S. Chumak, Yu. P. Pershyn, J. F. Seely, A. Yu. Devizenko, Evgeniy N. Zubarev, V. V. Kondratenko
Rok vydání:	2018
Předmět:	Barrier layer Radiation Materials science chemistry business.industry X-ray chemistry.chemical_element Optoelectronics General Materials Science Tungsten Condensed Matter Physics business
Zdroj:	Journal of Nano- and Electronic Physics. 10:02032-1
ISSN:	2306-4277 2077-6772
DOI:	10.21272/jnep.10(2).02032
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::3d25d8eb826faf5497b24d295efbae18 https://doi.org/10.21272/jnep.10(2).02032 Zobrazit plný text záznamu