| Autor: |
Barry J. Rubin, G.V. Kopcsay, Bruce J. Chamberlin, T.-M. Winkel, George A. Katopis, C.W. Surovic, Roger S. Krabbenhoft, Alina Deutsch |
| Rok vydání: |
2005 |
| Předmět: |
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| Zdroj: |
IEEE Transactions on Advanced Packaging. 28:4-12 |
| ISSN: |
1521-3323 |
| DOI: |
10.1109/tadvp.2004.841679 |
| Popis: |
In this paper, the self-consistent, frequency-dependent dielectric constant epsivr(f) and dielectric loss tandelta(f) of several materials are determined over the range 2 to 30 GHz using a short-pulse propagation technique and an iterative extraction based on a rational function expansion. The simple measurement technique is performed in the time domain on representative printed circuit board wiring. Broadband, fully causal transmission-line models based on these results are generated up to 50 GHz for card wiring using low loss materials including BT, Nelco N4000-13, and Nelco N4000-13SI. Simulation and modeling results highlight the need for the accurate frequency-dependent dielectric loss extraction. Signal propagation based on these results shows very good agreement with measured step and pulse time-domain excitations and provides validation of the measurement and model generation technique |
| Databáze: |
OpenAIRE |
| Externí odkaz: |
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