An Accurate and Simple Method for Measurement of RF Characterization in Thin Substrate

Autor:	Sang Hyuck Han, Ikhwan Kim, Ju-Ik Oh, Hyo-Won Lee, Seong-Jin Kim, Jong-Won Yu
Rok vydání:	2022
Zdroj:	2022 International Symposium on Antennas and Propagation (ISAP).
DOI:	10.1109/isap53582.2022.9998792
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::3cf1dfd5afdb4d6ce96f6c950f6406ad https://doi.org/10.1109/isap53582.2022.9998792 Zobrazit plný text záznamu