Determining large step heights using zero-order interference fringe identification and an external cavity diode laser
| Autor: | Jing-Heng Chen, Liang-Chih Chang, Yu-Ping Lan, Ching-Fen Kao, Sheng-Hua Lu |
|---|---|
| Rok vydání: | 2006 |
| Předmět: |
White light interferometry
Materials science business.industry Physics::Optics Laser Interference (wave propagation) Atomic and Molecular Physics and Optics Electronic Optical and Magnetic Materials law.invention Metrology Interferometry Wavelength White light scanner Optics law Astronomical interferometer Electrical and Electronic Engineering Physical and Theoretical Chemistry business |
| Zdroj: | Optics Communications. 259:14-18 |
| ISSN: | 0030-4018 |
| DOI: | 10.1016/j.optcom.2005.08.045 |
| Popis: | Zero-order interference fringe identification is a powerful tool for measuring large step heights. In contrast to white light scanning interferometry, this study utilizes an external cavity diode laser as the light source. The zero-path difference point can be accurately identified by combining wavelength scanning interferometry, in which the laser wavelength is continuously changed, with single wavelength interferometry, in which the laser wavelength is fixed. The experimental apparatus is a two-arm interferometer containing the sample in the measurement arm. The step height denotes the distance between two locations of a zero-order interference fringe, which are obtained by continuously varying the length of the reference arm. The accuracy of a sample of 10 mm step height was found to be 0.33 μm. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
|
Full Text from ScienceDirect