Multiwall carbon nanotube tips for scanning probe microscopy
Autor: | A. G. Tomishko, O. V. Demicheva, O. V. Sinitsyna, Igor V. Yaminsky, G. B. Meshkov |
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Rok vydání: | 2008 |
Předmět: | |
Zdroj: | Nanotechnologies in Russia. 3:704-709 |
ISSN: | 1995-0799 1995-0780 |
Popis: | In this work, multiwall carbon nanotube tips, which are assembled on the apexes of nichrome wires and AFM cantilevers, were tested. The fabricated probes exhibited high image resolution, namely, 2-6 nm in the sample plane and 2-3 A in the vertical direction. It was shown that extreme force acting did not cause the degradation of the tips. |
Databáze: | OpenAIRE |
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