Multiwall carbon nanotube tips for scanning probe microscopy

Autor:	A. G. Tomishko, O. V. Demicheva, O. V. Sinitsyna, Igor V. Yaminsky, G. B. Meshkov
Rok vydání:	2008
Předmět:	Materials science Cantilever business.industry Atomic force microscopy General Engineering Nanotechnology Carbon nanotube Condensed Matter Physics law.invention Sample plane Scanning probe microscopy law Vertical direction Optoelectronics General Materials Science Nichrome business Image resolution
Zdroj:	Nanotechnologies in Russia. 3:704-709
ISSN:	1995-0799 1995-0780
Popis:	In this work, multiwall carbon nanotube tips, which are assembled on the apexes of nichrome wires and AFM cantilevers, were tested. The fabricated probes exhibited high image resolution, namely, 2-6 nm in the sample plane and 2-3 A in the vertical direction. It was shown that extreme force acting did not cause the degradation of the tips.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::3ce82a5cc1cf2907a02233530de13c62 https://doi.org/10.1134/s1995078008110062 Zobrazit plný text záznamu Full text from SpringerLink