Optical alignment and compensation control of die bonder for chips containing through-silicon vias
| Autor: | Kuo Liang Huang, Chang-Yu Hung, Ke-Chun Lin, Chern-Sheng Lin, Chung Ting Chen |
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| Rok vydání: | 2019 |
| Předmět: |
Through-silicon via
Machine vision Computer science business.industry Three-dimensional integrated circuit Image processing 02 engineering and technology Integrated circuit 021001 nanoscience & nanotechnology Chip 01 natural sciences Industrial and Manufacturing Engineering Die (integrated circuit) law.invention Compensation (engineering) 010309 optics Control and Systems Engineering law 0103 physical sciences 0210 nano-technology business Computer hardware |
| Zdroj: | Assembly Automation. 40:917-923 |
| ISSN: | 0144-5154 |
| Popis: | Purpose This study aims to present an optical alignment and compensation control of die bonder for chips containing through-silicon vias and develop three-dimensional integrated circuit stacked packaging for compact size and multifunction. Design/methodology/approach The machine vision, optical alignment method and sub-pixel technology in dynamic imaging condition are used. Through a comparison of reference image, the chip alignment calibration can improve machine accuracy and stability. Findings According to the experimental data and preliminary results of the analysis, accuracy can be achieved within the desired range, and the accuracy is much better than traditional die bonder equipment. The results help further research in die bonder for chips containing through-silicon vias. Originality/value In subsequent testing of the chip, the machine can simultaneously test multiple chips to save test time and increase productivity. |
| Databáze: | OpenAIRE |
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