Shear banding in strained semicrystalline polyamide 6 films as revealed by atomic force microscopy: Role of the amorphous phase
| Autor: | G. Coulon, V. Ferreiro |
|---|---|
| Rok vydání: | 2004 |
| Předmět: |
chemistry.chemical_classification
Yield (engineering) Materials science Polymers and Plastics Nucleation Polymer Condensed Matter Physics Amorphous solid Crystallinity chemistry Polymer chemistry Polyamide Ultimate tensile strength Materials Chemistry Physical and Theoretical Chemistry Composite material Shear band |
| Zdroj: | Journal of Polymer Science Part B: Polymer Physics. 42:687-701 |
| ISSN: | 1099-0488 0887-6266 |
| DOI: | 10.1002/polb.10731 |
| Popis: | Atomic force microscopy (AFM) has been used to visualize the plastic deformation mechanisms that are responsible for the yielding of semicrystalline polymers of low degree of crystallinity ( |
| Databáze: | OpenAIRE |
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