Experimental aspects of dissipation force microscopy

Autor:	Ch. Loppacher, Roland Bennewitz, Alexis Baratoff, S. Schär, V. Barwich, M. Guggisberg, O. Pfeiffer, M. Bammerlin, Ernst Meyer
Rok vydání:	2000
Předmět:	Physics Microscopy Force dynamics Biasing Tunneling current Dissipation Atomic physics Non-contact atomic force microscopy Atomic units Oscillation amplitude
Zdroj:	Physical Review B. 62:13674-13679
ISSN:	1095-3795 0163-1829
DOI:	10.1103/physrevb.62.13674
Popis:	Experimental aspects of measuring dissipation on atomic scale using large-amplitude dynamic force microscopy are discussed. Dissipation versus distance curves reveal that long- and short-range forces contribute to the dissipation. The decay length of short-range contributions is found to be close to that of the tunneling current. The dependence of dissipation on the bias voltage and on the oscillation amplitude is presented. Atomic-scale lateral variations of dissipation are discussed, and the role of the atomic constitution of the tip for quantitative results is pointed out.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::3c5fb9687031889e95ef3103e2fc02f5 https://doi.org/10.1103/physrevb.62.13674 Zobrazit plný text záznamu