Characterization of Birefringence of Optical Disk Substrates Using a Novel Ellipsometric Approach

Autor:	Hong Fu, S. Sugaya, J.K. Erwin, M. Mansuripur
Rok vydání:	1994
Zdroj:	Optical Data Storage.
DOI:	10.1364/ods.1994.mc4
Popis:	The birefringence of polycarbonate optical disk substrates is of great concern because of its negative effects on the performance of optical data storage systems. In this presentation we describe our results in characterization of birefringence using ellipsometry.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::3c27ca72007c1053063cc8cbfe1b2d8b https://doi.org/10.1364/ods.1994.mc4 Zobrazit plný text záznamu