Autor: |
S.E. Darden, H.R. Hiddleston, J.P. Martin, J.L. Foster |
Rok vydání: |
1973 |
Předmět: |
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Zdroj: |
Nuclear Instruments and Methods. 113:477-482 |
ISSN: |
0029-554X |
DOI: |
10.1016/0029-554x(73)90741-6 |
Popis: |
The analyzing power for proton scattering on the ground state and the 1.78 MeV level of silicon has been measured at 34 energies in the 4 to 16 MeV range. Angular coverage was from 20 deg to 170 deg in 10 deg increments. This information is of particular interest for the design of high efficiency double scattering polarimeters using a silicon detector as the analyzer. A detailed calculation for a realistic polarimeter geometry has been completed, which yields a uniform analyzing power of 0.4 for 9.5 to 16 MeV protons, with an efficiency of 0.6 x 10/sup -4/. (auth) |
Databáze: |
OpenAIRE |
Externí odkaz: |
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