New Real-Time Fluence Correction Method With SRAM Dosimeter for High Accuracy Single-Event Upset Evaluation

Autor:	Raehwan Yoon, Dongwoo Bae, Kiseog Kim, Sung S. Chung, Joongsik Kih, Hyeokjae Lee, Seungjoo Woo, Changhee Cho, Jonghoon Yoo, Stephen A. Wender, Youngboo Kim
Rok vydání:	2023
Předmět:	Nuclear and High Energy Physics Nuclear Energy and Engineering Electrical and Electronic Engineering
Zdroj:	IEEE Transactions on Nuclear Science. 70:815-822
ISSN:	1558-1578 0018-9499
DOI:	10.1109/tns.2023.3243555
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::3bf66ffd60bd567e4b95cc9d3f69cc76 https://doi.org/10.1109/tns.2023.3243555 Zobrazit plný text záznamu