Autor: |
E. Jourdanneau, P. Joly, D. Petermann, Stéphan Rouzière, B. Kasmi, Pierre-Antoine Albouy |
Rok vydání: |
2010 |
Předmět: |
|
Zdroj: |
Journal of Applied Crystallography. 43:1131-1133 |
ISSN: |
0021-8898 |
DOI: |
10.1107/s0021889810027901 |
Popis: |
A prototype instrument has been developed which allows the simultaneous acquisition of both X-ray diffraction and X-ray fluorescence data at a microscopic length scale for mapping studies on materials. The instrument takes full advantage of the performance of recently developed optics and detectors to optimize the detection of low-intensity signals with a monochromatic X-ray microbeam of 20 µm diameter with a laboratory X-ray source. |
Databáze: |
OpenAIRE |
Externí odkaz: |
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