| Autor: |
Eric Lin, Pon Florence R, Harry Q. Pon, Robert E. Frickey, James P. Slattery, Gogineni Sireesha, Justin R. Dayacap, Peter Joseph |
| Rok vydání: |
2014 |
| Předmět: |
|
| Zdroj: |
2014 IEEE 6th International Memory Workshop (IMW). |
| DOI: |
10.1109/imw.2014.6849373 |
| Popis: |
Solid-State Drives (SSDs) have impacted the computing platform and storage industry by providing substantially higher bandwidth random and sequential read write performance compared to Hard Disk Drives (HDDs). Due to these storage performance benefits, SSDs have also demanded more and stressed the NAND components beyond the typical usage models of removable storage media. In this work, several key SSD and NAND component reliability issues as the result of extra performance demands are examined in their respective forms. These include the effects of drive cycling with associated temperature bake, NAND component read disturb, NAND “XOR” (internal RAID), and SSD mechanical reliability issues. Data and results from these respective SSD reliability areas will be presented and discussed. |
| Databáze: |
OpenAIRE |
| Externí odkaz: |
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