Application of generalized standard additions method to inductively coupled plasma atomic emission spectroscopy with an echelle spectrometer and segmented-array charge-coupled detectors
| Autor: | Robert S. Houk, Ho-ming Pang, Shen Luan |
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| Rok vydání: | 1995 |
| Předmět: |
Spectrometer
Chemistry Atomic emission spectroscopy Analytical chemistry Atomic and Molecular Physics and Optics Spectral line Analytical Chemistry Polychromator Standard addition Inductively coupled plasma atomic emission spectroscopy Inductively coupled plasma Instrumentation Spectroscopy Echelle grating |
| Zdroj: | Spectrochimica Acta Part B: Atomic Spectroscopy. 50:791-801 |
| ISSN: | 0584-8547 |
| Popis: | Simultaneous correction for both spectral interferences and matrix effects in inductively coupled plasma atomic emission spectrometry can be accomplished by using the generalized standard additions method (GSAM). Results obtained with the application of the GSAM to the Perkin-Elmer Optima 3000 ICP atomic emission spectrometer are presented. The echelle-based polychromator with segmented-array charge-coupled device detectors enables the direct, visual examination of the overlapping lines Cd(I) 228.802 nm and As(I)228.812 nm. The slit translation capability allows a large number of data points to be sampled; therefore, the advantage of noise averaging is gained. Pure spectra of each of the spectrally active components in the sample can be extracted through the GSAM calculation. |
| Databáze: | OpenAIRE |
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