| Autor: |
Paul W. Marshall, Marco Bellini, A.P.G. Prakash, Laleh Najafizadeh, John D. Cressler, Cheryl J. Marshall, G. Espinel |
| Rok vydání: |
2006 |
| Předmět: |
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| Zdroj: |
IEEE Transactions on Nuclear Science. 53:3210-3216 |
| ISSN: |
0018-9499 |
| Popis: |
A comprehensive investigation of the effects of proton irradiation on the performance of SiGe BiCMOS precision voltage references intended for extreme environment operational conditions is presented. The voltage reference circuits were designed in two distinct SiGe BiCMOS technology platforms (first generation (50 GHz) and third generation (200 GHz)) in order to investigate the effect of technology scaling. The circuits were irradiated at both room temperature and at 77 K. Measurement results from the experiments indicate that the proton-induced changes in the SiGe bandgap references are minor, even down to cryogenic temperatures, clearly good news for the potential application of SiGe mixed-signal circuits in emerging extreme environments |
| Databáze: |
OpenAIRE |
| Externí odkaz: |
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