Energy dispersive X-ray reflectivity to study phase transitions in thin films

Autor:	M. Bhattacharya, Milan K. Sanyal, Shubhadeep Pal, M. K. Mukhopadhyay
Rok vydání:	2004
Předmět:	Phase transition Radiation Materials science business.industry Resolution (electron density) Langmuir–Blodgett film Thermal expansion Synchrotron law.invention X-ray reflectivity Optics law Thermal Thin film business
Zdroj:	Radiation Physics and Chemistry. 70:611-617
ISSN:	0969-806X
DOI:	10.1016/j.radphyschem.2003.12.031
Popis:	We present here characteristics of energy dispersive X-ray reflectivity (EDR) technique that is suitable for studying phase transitions in thin films at both laboratory and synchrotron sources. In spite of the poorer resolution of this technique as compare to more widely used angle dispersive reflectivity technique, rapid data collection capability of the EDR technique will find applications in the studies of nano-structured thin films. We demonstrate merit of this technique here using results of thermal properties of thin organic films.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::3ac2537f98e6b2aa8a1a264544f634d8 https://doi.org/10.1016/j.radphyschem.2003.12.031 Zobrazit plný text záznamu Full Text from ScienceDirect