Diagnosis and characterization of timing-related defects by time-dependent light emission
| Autor: | Jeffrey A. Kash, Daniel R. Knebel, Phillip J. Nigh, Leendert M. Huisman, Peilin Song, David P. Vallett, Franco Motika, James C. Tsang, Richard F. Rizzolo, Moyra K. McManus, Pia Naoko Sanda |
|---|---|
| Rok vydání: | 2002 |
| Předmět: |
Circuit switching
Resistive touchscreen Engineering business.industry Transistor Static timing analysis Hardware_PERFORMANCEANDRELIABILITY Integrated circuit Timing failure Circuit extraction law.invention law Hardware_INTEGRATEDCIRCUITS Electronic engineering Light emission business Hardware_LOGICDESIGN |
| Zdroj: | ITC |
| DOI: | 10.1109/test.1998.743254 |
| Popis: | Technological advances such as flip-chip packaging, multiple hierarchical wiring planes, and ultra-high frequencies reduce the effectiveness of conventional diagnostic techniques. It has recently been demonstrated that light pulses emitted during circuit switching can be used to characterize the behaviour of integrated circuits. In this paper, a new method of circuit characterization using this technique is described. An example of the diagnosis of a timing failure caused by a resistive path to a single transistor is described. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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