Recoil spectrometry: Ion accelerator based elemental characterisation of surface layers

Autor: Scott R. Walker, Mikael Östling, P. Anders Ingemarsson, Mohamed El Bouanani, Leif Persson, Erik Johanson, Carina Zaring, Ian F. Bubb, Peter N. Johnston, Nick Dytlewski, Margaretha Andersson, Sture Hogmark, Mikael Hult, David D. Cohen, Harry J. Whitlow, Nils Lundberg
Rok vydání: 1995
Předmět:
Zdroj: Mikrochimica Acta. 120:171-181
ISSN: 1436-5073
0026-3672
DOI: 10.1007/bf01244430
Popis: Recoil Spectrometry covers a group of techniques that are very similar to the well known Rutherford backscattering Spectrometry technique, but with the important difference that one measures the recoiling target atom rather than the projectile ion. This makes it possible to determine both the identity of the recoil and its depth of origin from its energy and velocity, using a suitable detector system. The incident ion is typically high-energy (30–100MeV)35C1,81Br or127I. Low concentrations of light elements such as C, O and N can be profiled in a heavy matrix such as Fe or GaAs. Here we present an overview of mass and energy dispersive recoil Spectrometry and illustrate its successful use in some typical applications.
Databáze: OpenAIRE
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