Accelerator-Based Thermal-Neutron Beam by Compact and Low-Cost Moderator for Soft-Error Evaluation in Semiconductor Devices
| Autor: | Taiki Uemura, Byungjin Chung, Jegon Kim, Hyewon Shim, Shinyoung Chung, Brandon Lee, Jaehee Choi, Shota Ohnishi, Ken Machida |
|---|---|
| Rok vydání: | 2022 |
| Zdroj: | 2022 IEEE International Reliability Physics Symposium (IRPS). |
| DOI: | 10.1109/irps48227.2022.9764438 |
| Databáze: | OpenAIRE |
| Externí odkaz: |
|