Composition and Structure of β-SiC(100)-(2 × 2) Surfaces Monitored by Photoemission Spectroscopy using Synchrotron Radiation
| Autor: | S. Rivillon, F. Semond, Z. Hurych, F. Amy, L. Douillard, D. Dunham, Patrick Soukiassian |
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| Rok vydání: | 1998 |
| Předmět: |
Materials science
Photoemission spectroscopy Inverse photoemission spectroscopy Analytical chemistry Synchrotron radiation Angle-resolved photoemission spectroscopy Surfaces and Interfaces Condensed Matter Physics Surfaces Coatings and Films Core (optical fiber) Materials Chemistry Valence band Single domain Surface reconstruction |
| Zdroj: | Surface Review and Letters. :213-217 |
| ISSN: | 1793-6667 0218-625X |
| DOI: | 10.1142/s0218625x98000396 |
| Popis: | We investigate the single domain β-SiC(100)-(2 × 1) surface reconstruction by core level and valence band photoemission spectroscopies using synchrotron radiation. Specific spectral features at the Si 2p and C 1s core levels including bulk and surface core level shifts, and in the valence band, bring experimental evidence of reproducible β-SiC(100)-(2 × 1) structures having different Si/C compositions ranging from Si-terminated to Si- + C-containing surfaces. |
| Databáze: | OpenAIRE |
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