A Method to Measure Polarization Signal of Nanoscale One-Transistor-One-Capacitor Ferroelectric Memory

Autor:	Kai-Chun Chang, Po-Hsun Chen, Ting-Chang Chang, Yung-Fang Tan, Wen-Chung Chen, Chien-Hung Yeh, Fong-Min Ciou, Mao-Chou Tai, Tsung-Ming Tsai, Simon Sze
Rok vydání:	2022
Předmět:	Electrical and Electronic Engineering Electronic Optical and Magnetic Materials
Zdroj:	IEEE Electron Device Letters. 43:862-865
ISSN:	1558-0563 0741-3106
DOI:	10.1109/led.2022.3166180
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::3966845c3aa5051c729da3bb409f47d1 https://doi.org/10.1109/led.2022.3166180 Zobrazit plný text záznamu