A novel variable-centric fault localization technique
| Autor: | Jeong Ho Kim, Jindae Kim, Eunseok Lee |
|---|---|
| Rok vydání: | 2018 |
| Předmět: |
Computer science
business.industry media_common.quotation_subject 020207 software engineering Pattern recognition 02 engineering and technology Test case Debugging 020204 information systems 0202 electrical engineering electronic engineering information engineering Leverage (statistics) Software debugging Artificial intelligence business media_common |
| Zdroj: | ICSE (Companion Volume) |
| DOI: | 10.1145/3183440.3194956 |
| Popis: | Fault localization is one of the most important debugging tasks. Therefore, many techniques have already been developed to improve the efficiency. Among them, the spectrum-based fault localization technique is the most popular, and it has been the subject of 35% of total fault localization-related studies. SFL techniques leverage coverage spectra and localize a fault based on the coverage difference between passed and failed test cases. However, it is difficult to localize faults effectively when coverage differences are not clear. Therefore, we propose a novel variable-centric fault localization technique to improve performance of existing techniques. Proposed technique extracts suspicious variables and uses them to generate a suspicious ranked list. In an evaluation with 120 C faults, the proposed technique outperforms SFL techniques with the same similarity coefficient. The average Exam score of proposed techniques are reduced by 55% compared to SFL techniques. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
|