Absolute measurements of the reflection coefficients of multilayer x-ray mirrors in the ultrasoft x-ray region

Autor:	I. I. Lyakhovskaya
Rok vydání:	1995
Předmět:	Physics business.industry Astrophysics::High Energy Astrophysical Phenomena X-ray Radiation Electron beam physical vapor deposition Condensed Matter::Materials Science Quality (physics) Optics Interference (communication) Cavity magnetron Reflection (physics) Specular reflection business
Zdroj:	SPIE Proceedings.
ISSN:	0277-786X
DOI:	10.1117/12.200281
Popis:	The angular dependencies of the reflection coefficients of ultrasoft X- ray radiation by X-ray interference mirrors were investigated for samples prepared by two methods: magnetron spattering and electron beam evaporation. The theoretical evaluations of these reflection coefficients were compared with the obtained experimental results. The investigated multilayer X-ray mirrors were found to have extremely high quality.
Databáze:	OpenAIRE
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