Characterizing and Modelling of the BTI Reliability in IGZO-TFT using Light-assisted I-V Spectroscopy

Autor:	Z. Wu, A. Chasin, J. Franco, S. Subhechha, H. Dekkers, Y.V. Bhuvaneshwari, A. Belmonte, N. Rassoul, M.J. van Setten, V. Afanas'Ev, R. Delhougne, B. Kaczer, G.S. Kar
Rok vydání:	2022
Zdroj:	2022 International Electron Devices Meeting (IEDM).
DOI:	10.1109/iedm45625.2022.10019454
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::3915403f150d6c5c04321b4809512bca https://doi.org/10.1109/iedm45625.2022.10019454 Zobrazit plný text záznamu