Characterization of silicon spheres for Spheral Solar cells

Autor:	J.K. Arch, Mowafak Al-Jassim, J.S. Reynolds, R. K. Ahrenkiel, Sally Asher, K.M. Jones, M.D. Hammerbacher
Rok vydání:	2002
Předmět:	Silicon business.industry Photoconductivity chemistry.chemical_element Nanotechnology Engineering physics Crystallographic defect Renewable energy Characterization (materials science) Secondary ion mass spectrometry chemistry Impurity SPHERES business
Zdroj:	Proceedings of 1994 IEEE 1st World Conference on Photovoltaic Energy Conversion - WCPEC (A Joint Conference of PVSC, PVSEC and PSEC).
DOI:	10.1109/wcpec.1994.520200
Popis:	This paper discusses the accomplishments of a Cooperative Research and Development Agreement between Texas Instruments and the National Renewable Energy Laboratory (NREL). Secondary ion mass spectrometry (SIMS) has showed the predicted reduction in impurity levels due to silicon upgrading during Spheral Solar processing. Transmission electron microscopy (TEM) has uncovered defects near the surface of the spheres that could play a significant role in controlling sphere efficiency. Radio-frequency photoconductance decay (RF-PCD) measurements have shown significant promise as a predictor of the electrical performance of silicon spheres. An RF-PCD system similar to NREL's has been constructed at Texas Instruments and is being prototyped as a real-time monitor of material quality during sphere processing.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::38ad99b7e36efdca5b996e57ff8c1d20 https://doi.org/10.1109/wcpec.1994.520200 Zobrazit plný text záznamu