Wafer-Level Characterization of Silicon Nitride CWDM (De)Multiplexers Using Bayesian Inference
| Autor: | Tina X. Guo, Hong Wang, Soon Thor Lim, Thomas Y. L. Ang, Ching Eng Png, Jun Rong Ong |
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| Rok vydání: | 2020 |
| Předmět: |
Materials science
Physics::Optics Silicon on insulator Hardware_PERFORMANCEANDRELIABILITY Waveguide (optics) Multiplexer Multiplexing Atomic and Molecular Physics and Optics Computer Science::Other Electronic Optical and Magnetic Materials Interferometry Filter (video) Wavelength-division multiplexing Hardware_INTEGRATEDCIRCUITS Electronic engineering Wafer Electrical and Electronic Engineering |
| Zdroj: | IEEE Photonics Technology Letters. 32:917-920 |
| ISSN: | 1941-0174 1041-1135 |
| DOI: | 10.1109/lpt.2020.3004850 |
| Popis: | A cascaded Mach-Zehnder interferometer based filter for coarse wavelength (de)multiplexing (CWDM) at the O-band is fabricated and tested on a silicon nitride on SOI platform. We characterize the chip-to-chip performance variability of the filter devices on a wafer. Using the optical measurement data, we apply Bayesian inference methods to estimate the waveguide geometery parameters and also quantify the uncertainty of the estimates. |
| Databáze: | OpenAIRE |
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