Movement of Current Filaments and its Impact on Avalanche Robustness in Vertical GaN P-N diode Under UIS stress
Autor: | Bhawani Shankar, Ke Zeng, Brendan Gunning, Rafael Perez Martinez, Chuanzhe Meng, Jack Flicker, Andrew Binder, Jeramy Ray Dickerson, Robert Kaplar, Srabanti Chowdhury |
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Rok vydání: | 2022 |
Zdroj: | 2022 Device Research Conference (DRC). |
Databáze: | OpenAIRE |
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