Understanding fault-tolerance vulnerabilities in advanced SoC FPGAs for critical applications

Autor:	Natalia Cherezova, Konstantin Shibin, Maksim Jenihhin, Artur Jutman
Rok vydání:	2023
Předmět:	Electrical and Electronic Engineering Safety Risk Reliability and Quality Condensed Matter Physics Atomic and Molecular Physics and Optics Surfaces Coatings and Films Electronic Optical and Magnetic Materials
Zdroj:	Microelectronics Reliability. 146:115010
ISSN:	0026-2714
DOI:	10.1016/j.microrel.2023.115010
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::37d440e1c6053ad43ddac2d577c86370 https://doi.org/10.1016/j.microrel.2023.115010 Zobrazit plný text záznamu Full Text from ScienceDirect