Dependency of well-contact density on MCUs in 65-nm bulk CMOS SRAM

Autor:	Jianjun Chen, Cheng Xie, Yueyue Chen, Jizuo Zhang
Rok vydání:	2018
Předmět:	Heavy particle radiation Dependency (UML) General Computer Science CMOS business.industry Computer science Optoelectronics Contact density Static random-access memory business
Zdroj:	Science China Information Sciences. 62
ISSN:	1869-1919 1674-733X
DOI:	10.1007/s11432-017-9549-8
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::37a2fc8276d6c543439f48313735a0f7 https://doi.org/10.1007/s11432-017-9549-8 Zobrazit plný text záznamu Full text from SpringerLink