In situmeasurement of burdens in instrument transformer test systems
Autor: | Myungsoo Kim, Sung Won Kwon, Jae Kap Jung, Sang Hwa Lee |
---|---|
Rok vydání: | 2007 |
Předmět: |
business.industry
Computer science Applied Mathematics Linear variable differential transformer Flyback transformer Electrical engineering Distribution transformer Automotive engineering Current transformer law.invention law Instrument transformer business Transformer Delta-wye transformer Rotary variable differential transformer Instrumentation Engineering (miscellaneous) |
Zdroj: | Measurement Science and Technology. 18:1503-1510 |
ISSN: | 1361-6501 0957-0233 |
Popis: | Methods to measure the burdens of voltage transformers (VTs) and current transformers (CTs) in situ in instrument transformer test systems have been developed using non-reactive resistors connected in series with the VT secondary and in parallel with the CT secondary. This development was based on a theoretical analysis of the equivalent circuits of the instrument transformers. The burden values for the instrument transformers are obtained by measuring the ratio error (and phase displacement) with varying resistors. The values of the transformer burdens obtained using this method were consistent, within acceptable tolerances, with those measured using conventional methods. |
Databáze: | OpenAIRE |
Externí odkaz: |