I DDQ testing: A review
| Autor: | Ravi K. Gulati, Charles F. Hawkins, Jerry M. Soden, Weiwei Mao |
|---|---|
| Rok vydání: | 1992 |
| Předmět: |
Engineering
Quality management business.industry Hardware_PERFORMANCEANDRELIABILITY Integrated circuit design Iddq testing Fault detection and isolation Reliability engineering Reliability (semiconductor) Software CMOS Instrumentation (computer programming) Electrical and Electronic Engineering business |
| Zdroj: | Journal of Electronic Testing. 3:291-303 |
| ISSN: | 1573-0727 0923-8174 |
| Popis: | Quiescent power supply current (I DDQ ) testing of CMOS integrated circuits is a technique for production quality and reliability improvement, design validation, and failure analysis. It has been used for many years by a few companies and is now receiving wider acceptance as an industry tool. This article begins with a brief history of CMOS ICs to provide perspective on the origin of I DDQ testing. Next, the use of I DDQ testing for IC quality improvement through increased defect and fault detection is described. Then implementation issues are considered, including test pattern generation software, hardware instrumentation, limit setting, IC design guidelines, and defect diagnosis. An extended reference list is provided to help the reader obtain more information on specific aspects. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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