| Autor: |
A. A. Podolyan, V. N. Kravchenko, A. N. Kuryliuk, S. N. Naumenko, L. A. Voronzova, A. N. Krit, L. N. Yashchenko, L. P. Steblenko, D. V. Kalinichenko, Yu. L. Kobzar |
| Rok vydání: |
2017 |
| Předmět: |
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| Zdroj: |
Springer Proceedings in Physics ISBN: 9783319562445 |
| Popis: |
The effect of soft X-rays with photon energy W = 8 keV on the kinetics of decay photovoltage in solar silicon crystals is studied. The correlation between the radiation-stimulated change in the electrical characteristics of the investigated crystals and the evolution of their charge, structural state, and surface morphology is established. Also studied are the changes in the photovoltage decay kinetics caused by the action of X-rays on the solar Si – nanofilled polymer coating structures. It is shown that X-ray irradiation leads to quite big recombination losses in the case that the epoxy-urethane matrix contains a filler (polysiloxane particles (PSPs)) in the amount of 0.001 and 1.0 wt. %. At the same time, at PSP filler content of 0.5 wt. %, the passivation epoxy-urethane coatings exhibit an increased radiation resistance. |
| Databáze: |
OpenAIRE |
| Externí odkaz: |
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