Accelerated Light-Induced Degradation Test for Industrial Application
| Autor: | Lin, C.-M., Gläser, M., Malguth, E., Uredat, S., Bernhard, N., Lausch, D. |
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| Jazyk: | angličtina |
| Rok vydání: | 2017 |
| Předmět: | |
| DOI: | 10.4229/eupvsec20172017-2cv.2.85 |
| Popis: | 33rd European Photovoltaic Solar Energy Conference and Exhibition; 978-982 Light-induced degradation (LID) is a well-known problem of industrial silicon solar cells and can lead to severe electrical performance loss through the formation of recombination-active defects during the excess carrier injection by illumination or forward biasing. Thereby an effective LID inspection for industry is essential. Unfortunately, a standard LID test procedure based on the solar cell level is currently missing. Moreover, the maintenance of the traditional degradation source – light is challenging. In order to solve these concerns, a series of experiments are carried out for the development of a reliable and rapid LID test procedure upon a customer friendly LID test machine. Consequently, the commercially available machine, which utilizes current bias instead of light as the degradation source, was developed. Furthermore, four practical experiments which are of great interests to the solar cell suppliers are demonstrated. The high flexibility of operation of this machine was validated |
| Databáze: | OpenAIRE |
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