Effect of Atomic Hydrogen in SiNx Films for Gate Dielectric of Silicon-Based TFTs Fabricated at a Low-Temperature({less than or equal to} 150 °) by Cat-CVD

Autor: Ki-Su Keum, Kyoung-Min Lee, Jae-Dam Hwang, Kil-Sun No, Wan-Shick Hong
Rok vydání: 2011
Zdroj: ECS Meeting Abstracts. :62-62
ISSN: 2151-2043
DOI: 10.1149/ma2011-01/2/62
Popis: not Available.
Databáze: OpenAIRE