| Autor: | Gary M. Crosbie, W. T Donlon, Francis Johnson |
|---|---|
| Rok vydání: | 1997 |
| Předmět: |
Materials science
law Electrical resistivity and conductivity Electrical and Electronic Engineering Composite material Resistor Condensed Matter Physics Microstructure Temperature coefficient Atomic and Molecular Physics and Optics Sheet resistance Electronic Optical and Magnetic Materials law.invention |
| Zdroj: | Journal of Materials Science Materials in Electronics. 8:29-37 |
| ISSN: | 0957-4522 |
| DOI: | 10.1023/a:1018596719229 |
| Popis: | Elevated temperature processing parameters affect the microstructure and electrical behaviour of thick film resistors on alumina substrates. Blended resistors (DuPont QS87 series) with a nominal sheet resistivity of 56 kΩ/□ and temperature coefficient (TCR) less than ±100 p.p.m K-1 were fired in a laboratory process that simulated production ramp rates and atmosphere. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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